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Proceedings Paper

Automated Characterization Of Infrared Systems Spatial Resolution
Author(s): P E Thurlow
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Paper Abstract

An automated technique has been developed for predicting square wave response of infrared optical systems. The method avoids conventional physical measurements of square wave modulation employing bar reticle images. As a result, the method can be applied to theoretical (modeled) infrared optics as well as real optical systems, and can thus be used as a standard tool for resolution evaluation during all phases of system development and production.

Paper Details

Date Published: 31 October 1986
PDF: 4 pages
Proc. SPIE 0655, Optical System Design, Analysis, Production for Advanced Technology Systems, (31 October 1986); doi: 10.1117/12.938413
Show Author Affiliations
P E Thurlow, Santa Barbara Research Center (United States)


Published in SPIE Proceedings Vol. 0655:
Optical System Design, Analysis, Production for Advanced Technology Systems
Robert E. Fischer; Philip J. Rogers, Editor(s)

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