Share Email Print
cover

Proceedings Paper

Non-Optical Characterization Techniques For Optical Coatings
Author(s): Karl H Guenther
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In the various phases of the development, production, and use of optical thin film coatings, it is vital to choose proper materials not only with respect to their optical properties but just as essential with respect to their environmental durability. If envi-ronmental tests reveal failures in optical coatings, this may be due to interactions between the layers and/or between the substrate and the first layer. Such interactions can be established and analyzed by depth profiling using electron- and/or ion-beam methods. Empha-sis must be placed on the practicability of these analysis methods with dielectric coatings where difficulties may sometimes arise because of decomposition, diffusion or intermixing, and charging effects during analysis.

Paper Details

Date Published: 13 October 1986
PDF: 5 pages
Proc. SPIE 0652, Thin Film Technologies II, (13 October 1986); doi: 10.1117/12.938382
Show Author Affiliations
Karl H Guenther, University of Alabama in Huntsville (United States)


Published in SPIE Proceedings Vol. 0652:
Thin Film Technologies II
J. Roland Jacobsson, Editor(s)

© SPIE. Terms of Use
Back to Top