Share Email Print
cover

Proceedings Paper

Determination Of The Characterizing Parameters Of Rough Surfaces For Solar Energy Conversion
Author(s): M Kohl; K Gindele; M Mast
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Selective optical properties can be achieved by a suitable surface roughness. Characteristic parameters describing the roughness of the surface profile are the rms-roughness, the rms-slope, and the autocorrelation length. The relation between these parameters and the spectral reflectance of the considered surface is known approximately from the scalar scattering theory. Due to the dimensions of the investigated surface profiles the roughness measurements require scanning electron microscopy for surface imaging. For the statistical evaluation the image data are processed in a computer system, which performs the Fourier-transformation of the whole image. The square of the Fourier transform yields the spectrum of the spatial frequencies from which the autocorrelation function and the correlation length can be derived by inverse Fourier-transformation. The scanning electron microscope causes a systematic imaging error, which can be corrected by approximating the image signal as a superposition of the surface height and its slope. The results are compared with the results of spectral measurements of the specular as well as the hemispherical reflection in the IR-rage applying the scalar theory mentioned above for copper-oxide and chromium absorber coatings.

Paper Details

Date Published: 24 September 1986
PDF: 8 pages
Proc. SPIE 0653, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion V, (24 September 1986); doi: 10.1117/12.938334
Show Author Affiliations
M Kohl, University of Stuttgart (Germany)
K Gindele, University of Stuttgart (Germany)
M Mast, University of Stuttgart (Germany)


Published in SPIE Proceedings Vol. 0653:
Optical Materials Technology for Energy Efficiency and Solar Energy Conversion V
Claes-Goeran Granqvist; Carl M. Lampert; John J. Mason; Volker Wittwer, Editor(s)

© SPIE. Terms of Use
Back to Top