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Proceedings Paper

New Computer-Aided System For Automatic Fringe Analysis In Optical Metrologies
Author(s): B Breuckmann; W Thieme
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Paper Abstract

A new computer-aided system for automatic fringe analysis will be presented. This commercially available system is based on the phase-shift method. It enables the complete analysis of fringe patterns for various optical measuring techniques: 2-beam interferometry, speckle-interferometry, holography, photoelasticity, fringe-projecting methods, and Moire techniques.

Paper Details

Date Published: 17 November 1986
PDF: 5 pages
Proc. SPIE 0654, Automatic Optical Inspection, (17 November 1986); doi: 10.1117/12.938296
Show Author Affiliations
B Breuckmann, MAN, Technologie GmbH (Germany)
W Thieme, MAN, Technologie GmbH (Germany)


Published in SPIE Proceedings Vol. 0654:
Automatic Optical Inspection
Lionel R. Baker; H. John Caulfield, Editor(s)

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