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Proceedings Paper

A High Speed Automated Visual Inspection System
Author(s): A J McCollum; D E Kelly; B G Batchelor
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Paper Abstract

A description is given of an image processing system under development at UWIST. This is capable of a throughput of up to ten automated visual inspection tasks per second. When fully developed it will be a turnkey system for the factory floor. Running under control of an MC 68000 based host, it uses a linear array processor (LAP) designed at the UK's National Physical Laboratory (NPL). Software has been produced at the high and intermediate levels, and timing comparisons of image processing algorithms are made with two serial processors, the PDP 11/23 and the MC 68000.

Paper Details

Date Published: 17 November 1986
PDF: 9 pages
Proc. SPIE 0654, Automatic Optical Inspection, (17 November 1986); doi: 10.1117/12.938291
Show Author Affiliations
A J McCollum, University of Wales Institute of Science and Technology (United Kingdom)
D E Kelly, University of Wales Institute of Science and Technology (United Kingdom)
B G Batchelor, University of Wales Institute of Science and Technology (United Kingdom)


Published in SPIE Proceedings Vol. 0654:
Automatic Optical Inspection
Lionel R. Baker; H. John Caulfield, Editor(s)

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