Share Email Print

Proceedings Paper

Automatic Non Contact Measurement System For The Inspection Of Shapes Cut In Sheet Material
Author(s): J F Bremner
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The introduction of flexible manufacturing systems and the increased use of CNC/DNC machines creates a high capacity in a small batch production environment. As inspection is always an after event, it is usual in this environment to accurately measure the first off machined sheet, prior to the manufacture of the remainder of the batch. Assuming that the machine parameters, instructions, tool selection and use do not change, then the remainder of the batch should be made consistent with the first off inspected "good" item. Unless the whole batch is to be manufactured at risk, the CNC or DNC machinery is prevented from completing the remainder of the batch until the first item is satisfactorily inspected. Therefore this inspection must take place quickly in order to minimise the elapsed time factor and the loss of production capacity. Additionally, it is extremely difficult for an inspector to measure, check tolerances and positional accuracy of a multiplicity of shapes cut in a large area sheet, even when assisted by such conventional aids as touch probe coordinate measurement machines. Such machines are also not very applicable to the inspection of small features cut in thin material. Figure 1 shows a typical work-piece pattern which can be stepped and repeated across the total area of the sheet material, prior to being cut into its constituent parts. This paper describes the development of a Vision System for Automatic Measurement purposes and the initial experiences of its use as an inspection tool.

Paper Details

Date Published: 17 November 1986
PDF: 6 pages
Proc. SPIE 0654, Automatic Optical Inspection, (17 November 1986); doi: 10.1117/12.938280
Show Author Affiliations
J F Bremner, British Aerospace (United Kingdom)

Published in SPIE Proceedings Vol. 0654:
Automatic Optical Inspection
Lionel R. Baker; H. John Caulfield, Editor(s)

© SPIE. Terms of Use
Back to Top