Share Email Print
cover

Proceedings Paper

The Present Status Of Electronic Speckle Pattern Interferometry (E.S.P.I.) With Respect To Automatic Inspection And Measurement
Author(s): B D Bergquist; P C Montgomery; F Mendoza-Santoyo; P Henry; J Tyrer
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Recent developments in digital processing have renewed interest in E.S.P.I., whereby direct contouring is possible with fringes of interferometric quality. It is now possible to locate points on the object accurately in association with E.S.P.I. analysis, although a trade-off between point resolution and fringe visibility seems likely. Nevertheless the time is close for the development of a complete optical inspection system.

Paper Details

Date Published: 17 November 1986
PDF: 6 pages
Proc. SPIE 0654, Automatic Optical Inspection, (17 November 1986); doi: 10.1117/12.938274
Show Author Affiliations
B D Bergquist, Loughborough University of Technology (United Kingdom)
P C Montgomery, Loughborough University of Technology (United Kingdom)
F Mendoza-Santoyo, Loughborough University of Technology (United Kingdom)
P Henry, Loughborough University of Technology (United Kingdom)
J Tyrer, Loughborough University of Technology (United Kingdom)


Published in SPIE Proceedings Vol. 0654:
Automatic Optical Inspection
Lionel R. Baker; H. John Caulfield, Editor(s)

© SPIE. Terms of Use
Back to Top