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Proceedings Paper

Triangulation With Expanded Range Of Depth
Author(s): G Hausler; M Maul
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Paper Abstract

We present a scanning triangulation system for large objects with high lateral and longitudinal resolution. The system is based on axicons in the illumination device and on the use of the Scheimpflug-condition in the observation path. We describe a scanning-by-deflection geometry that minimizes the number of necessary detector pixels.

Paper Details

Date Published: 17 November 1986
PDF: 3 pages
Proc. SPIE 0654, Automatic Optical Inspection, (17 November 1986); doi: 10.1117/12.938261
Show Author Affiliations
G Hausler, Physikalisches Institut der Universitat Erlangen (Germany)
M Maul, Physikalisches Institut der Universitat Erlangen (Germany)

Published in SPIE Proceedings Vol. 0654:
Automatic Optical Inspection
Lionel R. Baker; H. John Caulfield, Editor(s)

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