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Proceedings Paper

Shearing Interferometer With Scanned Photodiode Array And Microcomputer For Automatic Transparency Distortion Measurements
Author(s): J. Taboada; A. J. Duelm
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Paper Abstract

A prototype optical system is described incorporating a scanning lateral shearing interferometer, self-scanned photodiode array, electronic bandpass filter, a counter and a microprocessor for the rapid automatic testing of large area transparencies such as air-craft windscreens. Optical anomalies as small as 0.005 diopters and ranging to ± 0.2 diopters can be readily measured. The system also automatically compensates for beam deviation and displacement during the scanning process with an adaptive gimbaled mirror which provides a measure of prismatic deviation to an accuracy of about ± 0.02 degrees.

Paper Details

Date Published: 15 December 1978
PDF: 7 pages
Proc. SPIE 0153, Advances in Optical Metrology I, (15 December 1978); doi: 10.1117/12.938229
Show Author Affiliations
J. Taboada, USAF School of Aerospace Medicine (United States)
A. J. Duelm, USAF School of Aerospace Medicine (United States)

Published in SPIE Proceedings Vol. 0153:
Advances in Optical Metrology I
N. Balasubramanian; James C. Wyant, Editor(s)

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