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Proceedings Paper

Photo-Optic Measuring Systems
Author(s): Elmer v. Harbert Jr.
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Paper Abstract

Photo-optic measuring systems are presently utilized for automatic and continuous measurements of manufactured parts and subassemblies. Measurable parameters are physical dimensions such as bore diameters; flatness and concentricities; surface perturbations, such as microfinish, seams, pits and scratches; and finally, mechanical defects, such as cracks, mislocations, or unusual gaps in assemblies. The basic unit of these systems is the bifurcated fiber-optic probe which scans the surface of the object in question. The probe assembly utilizes reflected light from the object returning via the fiber optics to the detector for generation of the information signal. The information signal is processed electronically to yield the required values. The measurement is accomplished then in milliseconds instead of seconds.

Paper Details

Date Published: 15 December 1978
PDF: 5 pages
Proc. SPIE 0153, Advances in Optical Metrology I, (15 December 1978); doi: 10.1117/12.938224
Show Author Affiliations
Elmer v. Harbert Jr., Systems Research Laboratories, Inc. (United States)

Published in SPIE Proceedings Vol. 0153:
Advances in Optical Metrology I
N. Balasubramanian; James C. Wyant, Editor(s)

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