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Proceedings Paper

Interferometric Measurement Of Large Aperture Infrared Windows
Author(s): Albert F. Slomba
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Paper Abstract

A versatile interferometer has been designed and built to evaluate infrared windows as large as 51 cm in diameter. Transmitted wavefront measurements may be made with an accuracy of 0.05λ peak-to-valley at 10.6 µm. Variations in refractive index of transmitting materials as small as 5 x 10-6 may be measured and mapped. Through the use of an auxiliary mirror, systems or components requiring a spherical wavefront at f/6 or slower may also be tested.

Paper Details

Date Published: 15 December 1978
PDF: 4 pages
Proc. SPIE 0153, Advances in Optical Metrology I, (15 December 1978); doi: 10.1117/12.938217
Show Author Affiliations
Albert F. Slomba, The Perkin-Elmer Corporation (United States)


Published in SPIE Proceedings Vol. 0153:
Advances in Optical Metrology I
N. Balasubramanian; James C. Wyant, Editor(s)

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