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Proceedings Paper

Unequal Path Interferometer Alignment And Use
Author(s): Robert J. Zielinski
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Paper Abstract

A step-by-step process for aligning an unequal path interferometer is given. The interferometer as an optical test tool is discussed as are configurations for evaluating a variety of optical components and systems.

Paper Details

Date Published: 15 December 1978
PDF: 5 pages
Proc. SPIE 0153, Advances in Optical Metrology I, (15 December 1978); doi: 10.1117/12.938215
Show Author Affiliations
Robert J. Zielinski, Itek Corporation (United States)


Published in SPIE Proceedings Vol. 0153:
Advances in Optical Metrology I
N. Balasubramanian; James C. Wyant, Editor(s)

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