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Proceedings Paper

Electro-Optical Techniques For Non-Contact Circuit Probing
Author(s): Peter D. Poulsen
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Paper Abstract

A system was fabricated to demonstrate the utility of non-contact electro-optical switching to the testing of electronic circuit boards at the component level. This paper summarizes the results of tests on inventory avionics circuit boards and reviews the under-lying concepts for the new non-contact probing technique.

Paper Details

Date Published: 15 December 1978
PDF: 9 pages
Proc. SPIE 0153, Advances in Optical Metrology I, (15 December 1978); doi: 10.1117/12.938213
Show Author Affiliations
Peter D. Poulsen, Science Applications, Inc. (United States)


Published in SPIE Proceedings Vol. 0153:
Advances in Optical Metrology I
N. Balasubramanian; James C. Wyant, Editor(s)

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