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Proceedings Paper

A Novel Measurement Technique Of Loss And Facet Reflectivity For Semiconductor Optical Waveguide
Author(s): Yasushi Matsui; Masato Ishino; Toshihiro Fujita; Hiroyuki Serizawa; Takao Kajiwara
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Paper Abstract

We have proposed a novel technique to measure loss and facet reflectivity of semiconductor waveguides using Fabry-Perot resonance characterization. In order to obtain stable visibility of the optical transmittance, this technique has for the first time adopted a unique electro-optic effect instead of temperature-dependent Fabry-Perot resonance method. As a result, very accurate measurement has been realized as compared with those of currently available other measurement technique. Also we discussed the relation between spectral characteristics of incident light sources and waveguide parameters, and verified the conditions of this measurement to meet tight requirements of the waveguides.

Paper Details

Date Published: 3 November 1986
PDF: 9 pages
Proc. SPIE 0651, Integrated Optical Circuit Engineering III, (3 November 1986); doi: 10.1117/12.938161
Show Author Affiliations
Yasushi Matsui, Matsushita Electric Industrial Co., Ltd. (Japan)
Masato Ishino, Matsushita Electric Industrial Co., Ltd. (Japan)
Toshihiro Fujita, Matsushita Electric Industrial Co., Ltd. (Japan)
Hiroyuki Serizawa, Matsushita Electric Industrial Co., Ltd. (Japan)
Takao Kajiwara, Matsushita Electric Industrial Co., Ltd. (Japan)


Published in SPIE Proceedings Vol. 0651:
Integrated Optical Circuit Engineering III
Ralf Th. Kersten, Editor(s)

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