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Proceedings Paper

Computer Aided Measurement Techniques for Integrated Optic Devices
Author(s): H. F. Schlaak; G. Sulz; Yuan-ling Zhan; A. Brandenburg
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Paper Abstract

Computer aided measurement systems for the determination of nearfield intensity profiles, insertion loss, waveguide attenuation by Fabry-Perot resonance and refractive index profiles by effective indices have been developed. The repeatability and accuracy of the measurements have been analyzed.

Paper Details

Date Published: 3 November 1986
PDF: 6 pages
Proc. SPIE 0651, Integrated Optical Circuit Engineering III, (3 November 1986); doi: 10.1117/12.938157
Show Author Affiliations
H. F. Schlaak, Fraunhofer-Institut fur Physikalische MeBtechnik (Germany)
Siemens AG (Germany)
G. Sulz, Fraunhofer-Institut fur Physikalische MeBtechnik (Germany)
Yuan-ling Zhan, Fraunhofer-Institut fur Physikalische MeBtechnik (Germany)
Nankai University (China)
A. Brandenburg, Fraunhofer-Institut fur Physikalische MeBtechnik (Germany)


Published in SPIE Proceedings Vol. 0651:
Integrated Optical Circuit Engineering III
Ralf Th. Kersten, Editor(s)

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