Share Email Print
cover

Proceedings Paper

Computer Aided Measurement Techniques for Integrated Optic Devices
Author(s): H. F. Schlaak; G. Sulz; Yuan-ling Zhan; A. Brandenburg
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Computer aided measurement systems for the determination of nearfield intensity profiles, insertion loss, waveguide attenuation by Fabry-Perot resonance and refractive index profiles by effective indices have been developed. The repeatability and accuracy of the measurements have been analyzed.

Paper Details

Date Published: 3 November 1986
PDF: 6 pages
Proc. SPIE 0651, Integrated Optical Circuit Engineering III, (3 November 1986); doi: 10.1117/12.938157
Show Author Affiliations
H. F. Schlaak, Fraunhofer-Institut fur Physikalische MeBtechnik (Germany)
Siemens AG (Germany)
G. Sulz, Fraunhofer-Institut fur Physikalische MeBtechnik (Germany)
Yuan-ling Zhan, Fraunhofer-Institut fur Physikalische MeBtechnik (Germany)
Nankai University (China)
A. Brandenburg, Fraunhofer-Institut fur Physikalische MeBtechnik (Germany)


Published in SPIE Proceedings Vol. 0651:
Integrated Optical Circuit Engineering III
Ralf Th. Kersten, Editor(s)

© SPIE. Terms of Use
Back to Top