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Proceedings Paper

"Continuous" Pulsed Electronic Speckle Pattern Interferometry
Author(s): John R. Tyrer
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Paper Abstract

Holography and allied techliques such as electronic speckle pattern interferometry (ESPI) have the potential to provide the engineer with a powerful measuring technique. Why, therefore, is it not a technique readily available and widely used? Several arguments can be put forward; complexity, skill level, ease of use, in-situ capability, and ability to interpret results.

Paper Details

Date Published: 26 August 1987
PDF: 8 pages
Proc. SPIE 0732, 1st Intl Conf on Vibration Control in Optics and Metrology, (26 August 1987); doi: 10.1117/12.937913
Show Author Affiliations
John R. Tyrer, Loughborough University of Technology (United Kingdom)


Published in SPIE Proceedings Vol. 0732:
1st Intl Conf on Vibration Control in Optics and Metrology
Lionel R. Baker; Daniel Vukobratovich, Editor(s)

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