Share Email Print

Proceedings Paper

Applications Of A Low Cost System For Industrial Automatic Inspection
Author(s): C. Krey; A. Ayache; A. Bruel
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In industrial environment, some repetitive tasks wich do not need a high degree of understanding, can be solved automatically owing to Vision. Among the systems available on the market, most of them are rather expensive with various capabilities. The described system is a modular system, built with some standard circuit boards. One of the advantages of this system is that its architecture can be redefined for each application, by assembling judiciously the standard modules. The vision system has been used successfully to sort fruits according to their colour and diameter. The system can sort 8 fruits per second on each sorting line and manage simultaneously up to 16 lines. An application of sheep skin cutting has been implemented too. After chemical and mechanical treatments, the skins present many defaults all around their contour, that must be cut off. A movable camera follows and inspects the contour ; the vision system determines where the cutting device must cut the skin. A third application has been implemented ; it concerns automatic recording and reproduction of logotypes. A moving camera driven by the system picks up the points, of the logotype contours. Before reproduction, programs can modify the logotypes shape, change the scale, and so on. For every application, the system uses the world smallest CCD camera developped in the laboratory. The small dimensions of the vision system and its low cost are major advantages for a wide use in industrial automatic inspection.

Paper Details

Date Published: 18 May 1987
PDF: 8 pages
Proc. SPIE 0730, Automated Inspection and Measurement, (18 May 1987); doi: 10.1117/12.937878
Show Author Affiliations
C. Krey, L.S.I.-E.N.S.E.E.I.H.T. (France)
A. Ayache, L.S.I.-E.N.S.E.E.I.H.T. (France)
A. Bruel, L.S.I.-E.N.S.E.E.I.H.T. (France)

Published in SPIE Proceedings Vol. 0730:
Automated Inspection and Measurement
Michael J. W. Chen; Robert H. Thibadeau, Editor(s)

© SPIE. Terms of Use
Back to Top