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Proceedings Paper

Lasers and CCDs For Flash Measurement Of Small Diameters
Author(s): M. W. Siegel
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Paper Abstract

A pulsed diode laser casting a diffraction pattern shadow on a CCD is investigated as a non-contact micrometer. Data collected with a prototype instrument are compared with calculated diffraction patterns. Computational needs and possible techniques for diameter extraction are discussed.

Paper Details

Date Published: 18 May 1987
PDF: 4 pages
Proc. SPIE 0730, Automated Inspection and Measurement, (18 May 1987); doi: 10.1117/12.937866
Show Author Affiliations
M. W. Siegel, Carnegie Mellon University (United States)


Published in SPIE Proceedings Vol. 0730:
Automated Inspection and Measurement
Michael J. W. Chen; Robert H. Thibadeau, Editor(s)

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