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Proceedings Paper

Contour Control Point Algorithms For Shape Measurement And Inspection
Author(s): David W. Paglieroni; Anil K. Jain
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Paper Abstract

Motivated by the equivalence of two-dimensional shape and contour control points, techniques for making a number of popular shape measurements in control point space are presented. Then, a shape inspection scheme for locating test shape flaws is developed. Being primarily based on our jointly optimal spatial domain contour normalization algorithm, the inspection scheme applies to test shapes independent of their position, size and orientation.

Paper Details

Date Published: 18 May 1987
PDF: 9 pages
Proc. SPIE 0730, Automated Inspection and Measurement, (18 May 1987); doi: 10.1117/12.937864
Show Author Affiliations
David W. Paglieroni, University of California (United States)
Anil K. Jain, University of California (United States)

Published in SPIE Proceedings Vol. 0730:
Automated Inspection and Measurement
Michael J. W. Chen; Robert H. Thibadeau, Editor(s)

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