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Proceedings Paper

Parallel Edge Detection
Author(s): Yen C. Chu
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Paper Abstract

Parallel edges often provide a unique local feature for part recognition in manufacturing automation or robotic guidance applications. This paper discusses a simple parallel edge detection algorithm which takes the parallel edge as one entity instead of two separate edges. A special edge detection algorithm, step-state reasoning, is also discussed in this paper. The application of the algorithm and its accuracy and repeatability are discussed in the paper.

Paper Details

Date Published: 18 May 1987
PDF: 7 pages
Proc. SPIE 0730, Automated Inspection and Measurement, (18 May 1987); doi: 10.1117/12.937863
Show Author Affiliations
Yen C. Chu, FMC Corporation (United States)


Published in SPIE Proceedings Vol. 0730:
Automated Inspection and Measurement
Michael J. W. Chen; Robert H. Thibadeau, Editor(s)

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