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Proceedings Paper

Automated Measurement Of Surface Texture
Author(s): Lionel R. Baker
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Paper Abstract

Residual texture on the surfaces of highly finished components with Ra less than 25 nm can be readily seen by eye but less easily measured under conditions Obtaining in most engineering workshops. This paper summarises methods currently in use and describes a new approach which has the potential to quantify all aspects of texture including flaws, waviness and roughness. The method, which has already had success in quantifying flaws by measuring the proportion of light they remove from an illuminating beam, is now being extended to quantify other aspects of surface texture. The advantages and limitations of this approach compared with other methods are discussed.

Paper Details

Date Published: 18 May 1987
PDF: 6 pages
Proc. SPIE 0730, Automated Inspection and Measurement, (18 May 1987); doi: 10.1117/12.937862
Show Author Affiliations
Lionel R. Baker, Sira Ltd (United Kingdom)

Published in SPIE Proceedings Vol. 0730:
Automated Inspection and Measurement
Michael J. W. Chen; Robert H. Thibadeau, Editor(s)

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