Share Email Print

Proceedings Paper

Opto-Electronic Profile Measuring System
Author(s): Harald J. Schmalfuss
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The basic idea of a simple, but powerful opto-electronic profile measuring system and three practical examples are described. In general these systems are combinations of classical light sectioning techniques, modern sensors and special digital hardware components. Further applications, e.g. in the steel or automotive industry are possible.

Paper Details

Date Published: 18 May 1987
PDF: 4 pages
Proc. SPIE 0730, Automated Inspection and Measurement, (18 May 1987); doi: 10.1117/12.937860
Show Author Affiliations
Harald J. Schmalfuss, Battelle Institut e.V. (Germany)

Published in SPIE Proceedings Vol. 0730:
Automated Inspection and Measurement
Michael J. W. Chen; Robert H. Thibadeau, Editor(s)

© SPIE. Terms of Use
Back to Top