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Proceedings Paper

Developments In Image Processing For Industrial Inspection
Author(s): B. G. Batchelor; C. C. Bowman; K. W. Chow; S. J. Goodman; D. E. Kelly; A. J. McCollum; S. M. Rowland
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Paper Abstract

The suitability of a number of systems architectures for use in industrial inspection machines is briefly reviewed. Two different pipe-line processors, a (linear) array processor, an array of transputers, a concurrent array of (non-interconnected) von Neumann machines are all discussed. Where possible, measured execution speeds are given. The article concludes that no one system yet available is able to fulfil anything approaching a significant proportion of all inspection requirements. However, a clear view of the short-term future emerges, in which a combination of certain current ideas is perceived as providing a basis for a far more cost-effective 'general purpose' image processing system for industrial inspection than we have yet enjoyed.

Paper Details

Date Published: 18 May 1987
PDF: 13 pages
Proc. SPIE 0730, Automated Inspection and Measurement, (18 May 1987); doi: 10.1117/12.937855
Show Author Affiliations
B. G. Batchelor, University of Wales Institute of Science and Technology (United Kingdom)
C. C. Bowman, Department of Scientific & Industrial Research (New Zealand)
K. W. Chow, University of Wales Institute of Science and Technology (United Kingdom)
S. J. Goodman, University of Wales Institute of Science and Technology (United Kingdom)
D. E. Kelly, University of Wales Institute of Science and Technology (United Kingdom)
A. J. McCollum, University of Wales Institute of Science and Technology (United Kingdom)
S. M. Rowland, University of Wales Institute of Science and Technology (United Kingdom)


Published in SPIE Proceedings Vol. 0730:
Automated Inspection and Measurement
Michael J. W. Chen; Robert H. Thibadeau, Editor(s)

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