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Proceedings Paper

Data Conversion Method And Processor For Binary Patterns
Author(s): Olli Silven; Ilkka Virtanen
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Paper Abstract

A raster-scan algorithm and the corresponding hardware implementation for the approximation of binary pattern edges with line segments is described. The generated representation is more suitable for processing by conventional microprocessors than raw binary images or chain-code descriptions. The approach is used in an experimental printed wiring board inspection system.

Paper Details

Date Published: 18 May 1987
PDF: 6 pages
Proc. SPIE 0730, Automated Inspection and Measurement, (18 May 1987); doi: 10.1117/12.937851
Show Author Affiliations
Olli Silven, University of Oulu (Finland)
Ilkka Virtanen, University of Oulu (Finland)


Published in SPIE Proceedings Vol. 0730:
Automated Inspection and Measurement
Michael J. W. Chen; Robert H. Thibadeau, Editor(s)

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