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Proceedings Paper

Characterization of 820-nm Single Mode Fibers
Author(s): R. L. Flurer; A. J. Cordi; C. W. Colburn; B. M. Whitcomb; J. W. Ogle
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Paper Abstract

Increasing interest in the use of high bandwidth optical diagnostic measurement systems at the Nevada Test Site (NTS) has prompted the use of single mode fiber (SMF). In an ef-fort to improve the time response of experimental systems designed for use in the 800- to 900-nm spectrum, SMF optimized for 850-nm operation has been obtained. Experimental systems to characterize this fiber have been developed. Measurements to determine the fibers' bandwidth, material dispersion, mode field diameter (MFD), cut-off wavelength, numerical aperture (NA), and spectral attenuation have been completed. These experimental data are presented in the text.

Paper Details

Date Published: 4 February 1987
PDF: 7 pages
Proc. SPIE 0721, Fiber Optics in Adverse Environments III, (4 February 1987); doi: 10.1117/12.937632
Show Author Affiliations
R. L. Flurer, EG&G Energy Measurements, Inc. (United States)
A. J. Cordi, EG&G Energy Measurements, Inc. (United States)
C. W. Colburn, EG&G Energy Measurements, Inc. (United States)
B. M. Whitcomb, EG&G Energy Measurements, Inc. (United States)
J. W. Ogle, Los Alamos National Laboratory (United States)


Published in SPIE Proceedings Vol. 0721:
Fiber Optics in Adverse Environments III
Roger A. Greenwell, Editor(s)

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