Share Email Print
cover

Proceedings Paper

Considerations For Accelerated Laser Diode Life Testing
Author(s): G S Mecherle; J H Engleman
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A more generalized (Eyring) type of acceleration model for laser diodes is discussed which includes temperature, bulk current and optical power as accelerating stresses. This may allow greater accuracy in laser diode lifetime estimation and in prediction of the lifetime implications of changes in laser diode structural design. The effect of redundancy on laser diode lifetime requirements, diode parameters essential to fiber optic and free-space communication system operation, screening procedures, failure analysis, test configurations and environmental/equipment safeguards are also discussed.

Paper Details

Date Published: 23 February 1987
PDF: 10 pages
Proc. SPIE 0717, Reliability Considerations in Fiber Optic Applications, (23 February 1987); doi: 10.1117/12.937479
Show Author Affiliations
G S Mecherle, Hughes Aircraft Company (United States)
J H Engleman, Hughes Aircraft Company (United States)


Published in SPIE Proceedings Vol. 0717:
Reliability Considerations in Fiber Optic Applications
Dilip K. Paul, Editor(s)

© SPIE. Terms of Use
Back to Top