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Proceedings Paper

Optical Damage Effects In Z-Propagating LiNbO[sub]3[/sub] Channel Waveguides Fabricated On X- And Y-Cut Substrates
Author(s): N. A. Sanford; W. C. Robinson
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Paper Abstract

Channel waveguides produced parallel to the z-axis in x as well as y-cut LiNbO3 by Ti indiffusion are found to display severe optical damage in the form of coupling between TE and TM modes for power levels in the range of 1-100 microwatts at wavelengths of .633 and .488 microns. Previously, this orientation was thought to display little or no damage. The effect is manifest by both a steady state power dependent transfer of as much as 30% optical energy between orthogonally polarized modes as well as a transient regenerative switching between these modes seen only in x-cut samples subjected to continuous optical throughput at the above power levels for a period of 8-24 hours. A model of the observations is proposed based on photorefractive perturbations

Paper Details

Date Published: 10 March 1987
PDF: 4 pages
Proc. SPIE 0704, Integrated Optical Circuit Engineering IV, (10 March 1987); doi: 10.1117/12.937197
Show Author Affiliations
N. A. Sanford, Polaroid Corporation (United States)
W. C. Robinson, Polaroid Corporation (United States)


Published in SPIE Proceedings Vol. 0704:
Integrated Optical Circuit Engineering IV
Mark A. Mentzer; Sriram Sriram, Editor(s)

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