Share Email Print

Proceedings Paper

The Application Of Transmission Electron Microscopy To The Study Of Microstructures In Linbo[sub]3[/sub] Optical
Author(s): W. E. Lee
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The basic principles of Transmission Electron Microscopy are outlined and examples of microstructures observed in LiNbO3, waveguides reported. Defects present in the waveguides may have significant effects on their waveguiding ability. Various speculative arguments are suggested for the influence of these defects on the waveguide.

Paper Details

Date Published: 10 March 1987
PDF: 9 pages
Proc. SPIE 0704, Integrated Optical Circuit Engineering IV, (10 March 1987); doi: 10.1117/12.937167
Show Author Affiliations
W. E. Lee, The Ohio State University (United States)

Published in SPIE Proceedings Vol. 0704:
Integrated Optical Circuit Engineering IV
Mark A. Mentzer; Sriram Sriram, Editor(s)

© SPIE. Terms of Use
Back to Top