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Proceedings Paper

Polarization Sensitivity Of Ti:LiNbO[sub]3[/sub] Intensity Modulators
Author(s): R. W. Smith; J.M. P. Delavaux; C. Y. Kuo; T. V. Nguyen
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Paper Abstract

We have established the polarization dependence of the power penalty in a direct detection optical fiber communications system using an integrated lithium niobate traveling-wave intensity modulator at 1.3 microns.

Paper Details

Date Published: 10 March 1987
PDF: 8 pages
Proc. SPIE 0704, Integrated Optical Circuit Engineering IV, (10 March 1987); doi: 10.1117/12.937153
Show Author Affiliations
R. W. Smith, AT&T Bell Laboratories (United States)
J.M. P. Delavaux, AT&T Bell Laboratories (United States)
C. Y. Kuo, AT&T Bell Laboratories (United States)
T. V. Nguyen, AT&T Bell Laboratories (United States)


Published in SPIE Proceedings Vol. 0704:
Integrated Optical Circuit Engineering IV
Mark A. Mentzer; Sriram Sriram, Editor(s)

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