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Proceedings Paper

Remote Nondestructive Material Analysis By Photothermal Interferometry
Author(s): Z. Sodnik; H. J. Tiziani
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Paper Abstract

Interferometry is used for the detection of thermal waves to study material properties. A symmetrical interferometer as thermal expansion detector was developed for photothermal nondestructive material analysis. After mixing a phase shifted reference signal electrically to the interferometer signal, phase and amplitude exchange phenomena have been observed.

Paper Details

Date Published: 10 July 1987
PDF: 4 pages
Proc. SPIE 0701, 1986 European Conf on Optics, Optical Systems and Applications, (10 July 1987); doi: 10.1117/12.937064
Show Author Affiliations
Z. Sodnik, Universitat Stuttgart (Germany)
H. J. Tiziani, Universitat Stuttgart (Germany)

Published in SPIE Proceedings Vol. 0701:
1986 European Conf on Optics, Optical Systems and Applications
Stefano Sottini; Silvana Trigari, Editor(s)

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