Share Email Print

Proceedings Paper

Real-Time Laser And Microcomputer System For Controlling The Process Of Producing Ultra-Thin Tungsten Wires Under 10 4On
Author(s): Hu Lin
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The evenness of ultra-thin tungsten wires under 10.1Vm is one of the most important technical indices, the ensuring of which being a difficult problem in technology yet to be solved by the manufacturers. The paper presents in concrete a proposal for real-time laser and microcomputer system for controlling the process of producing ultra-thin tungsten wires under 10μm, based on in-situ investigations and researches. Laser ultra-thin wire dynamic metering device of type JXD-1 worked out here was used in combination with electrolytic ultra-thin tungsten wire polishing installation in an integral system, fully ensuring quality of the products by realizing real-time monitor and control of processing through dynamic mea-surements of tungsten wire on line and closed-loop feedback.' The paper deals with the principles of measurement on line and real-time control by means of the system and precision analyses have been made, multiple compensation of errors, controlling tolerance zone and other measures to guarantee precision and stability of the entire system. It is concluded that evenness of diameter of wire over its entire length is kept assuredly within the tolerance range when the aforesaid system is used in the production of ultra-thin tungsten wires under 10 Atm.

Paper Details

Date Published: 28 October 1987
PDF: 6 pages
Proc. SPIE 0699, Laser and Opto-Electronic Technology in Industry: State-of-the-Art Review, (28 October 1987); doi: 10.1117/12.936923
Show Author Affiliations
Hu Lin, Zhengzhou Institute of Technology (China)

Published in SPIE Proceedings Vol. 0699:
Laser and Opto-Electronic Technology in Industry: State-of-the-Art Review
Jingtang Ke; Ryszard J. Pryputniewicz, Editor(s)

© SPIE. Terms of Use
Back to Top