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Proceedings Paper

Electronic Speckle Pattern Interferometry (E.S.P.I) For Dynamic Studies
Author(s): Oliverio D.D. Soares
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Paper Abstract

Non-destructive testing, particularly, in dynamical phenomena metrology, sensing, and control is a topic of major interest within optical metrology. Holography is rated as one of the most accurate techniques though of difficult practical implementation on industrial environment. Electronic holography or electronic speckle pattern interferometry (E.S.P.I.) is the credited alternative whenever lower resolution is not an impedement, and maximum advantages are to be gained from its TV based operating principle. A review is presented of improvements on E.S.P.I. techniques to further its technical capabilities and resolve some of the inconveniences of holography in industrial applications. Fibre optics was combined with synchronized amplitude and phase illuminating pulse modulation. Fringe enhancement was studied to remove coarsely appearance. Moire evaluation techniques were introduced for direct data extraction, increase of local sensitivity and reduction of inconveniences of high sensitivity of interferometric techniques.

Paper Details

Date Published: 28 October 1987
PDF: 14 pages
Proc. SPIE 0699, Laser and Opto-Electronic Technology in Industry: State-of-the-Art Review, (28 October 1987); doi: 10.1117/12.936904
Show Author Affiliations
Oliverio D.D. Soares, Universidade do Porto (Portugal)


Published in SPIE Proceedings Vol. 0699:
Laser and Opto-Electronic Technology in Industry: State-of-the-Art Review

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