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Proceedings Paper

New Write-Once Media Based On Te-Te02 For Optical Disks
Author(s): Takeo Ohta; Koichi Kotera; Kunio Kimura; Nobuo Akahira; Mutsuo Takenaga
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Paper Abstract

Thin film media composed of Te-Te02 (TeOx) containing Pd additive was found to have a feasibility of being applied to high reliability data file optical disks. The carrier to noise ratio (C.N.R.) exceeds 56 dB at 1,200 r.p.m. disk rotation. The response time of saturation amplitude after a pulsed laser power irradiation was less than 300 nsec and is able to apply to high speed read verify systems. From acceleration environmental stress test results, no defect variation was observed. By the Arrhenius plot method, the disk life has been estimated to be more than 10 years at the storage environment 32 degree C, 80 %RH. The recording and degradation mechanism will be also discussed.

Paper Details

Date Published: 14 January 1987
PDF: 8 pages
Proc. SPIE 0695, Optical Mass Data Storage II, (14 January 1987); doi: 10.1117/12.936809
Show Author Affiliations
Takeo Ohta, Matsushita Electric Industrial Co., Ltd. (Japan)
Koichi Kotera, Matsushita Electric Industrial Co., Ltd. (Japan)
Kunio Kimura, Matsushita Electric Industrial Co., Ltd. (Japan)
Nobuo Akahira, Matsushita Electric Industrial Co., Ltd. (Japan)
Mutsuo Takenaga, Matsushita Electric Industrial Co., Ltd. (Japan)


Published in SPIE Proceedings Vol. 0695:
Optical Mass Data Storage II
Robert P. Freese; Albert A. Jamberdino; Maarten R. de Haan, Editor(s)

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