Share Email Print
cover

Proceedings Paper

Real Time Two-Wavelength Holography for Coarse Aspherical Surface Contouring
Author(s): Chungte W . Chen
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Using two-wavelength holographic interferometry and a recyclable thermoplastic holographic camera, we developed a technique for real-time contouring of aspherical surfaces. Polished, fine-ground and coarse-ground surfaces were measured. Incorporating phase measurement interferometry with two-wavelength holographic interferometry, we have developed phase measurement two-wavelength holographic interferometry.

Paper Details

Date Published: 9 December 1983
PDF: 7 pages
Proc. SPIE 0433, Contemporary Methods of Optical Manufacturing and Testing, (9 December 1983); doi: 10.1117/12.936805
Show Author Affiliations
Chungte W . Chen, Hughes Optical Products, Inc. (United States)


Published in SPIE Proceedings Vol. 0433:
Contemporary Methods of Optical Manufacturing and Testing
Gregory M. Sanger, Editor(s)

© SPIE. Terms of Use
Back to Top