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Proceedings Paper

High Accuracy Emittance Measurement By Newly Designed Portable Device
Author(s): M. Sando; A. Fujii; S. Tanemura; T. Noguchi
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Paper Abstract

An emittance meter which utilizes internal standards by Au plated mirror and low temperature blackbody furnace as low and high emittance standards respectively has been developed. The obtained emittance value of which systematic error was compensated had accuracy within ±0.01 and precision within ±0.003. The long term drift of measured emittance value was also checked and confirmed to be within ±0.01 for one year continuous operation.

Paper Details

Date Published: 23 February 1987
PDF: 7 pages
Proc. SPIE 0692, Materials and Optics for Solar Energy Conversion and Advanced Lightning Technology, (23 February 1987); doi: 10.1117/12.936696
Show Author Affiliations
M. Sando, Government Industrial Research Institute (Japan)
A. Fujii, Government Industrial Research Institute (Japan)
S. Tanemura, Government Industrial Research Institute (Japan)
T. Noguchi, Japan Machinery & Metals Inspection Institute (Japan)


Published in SPIE Proceedings Vol. 0692:
Materials and Optics for Solar Energy Conversion and Advanced Lightning Technology
Sandor Holly; Carl M. Lampert, Editor(s)

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