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Proceedings Paper

X-Ray Fluorescence (XRF) Testing for Thickness in On-Site Controlled Construction of Specialty Coatings
Author(s): Thomas W. Oakes; Robert E. Oakes
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Paper Abstract

There are problems in the measurement of thickness of field-applied thick polymer coatings on iron and aluminum substrates. New ways are sought to accomplish this. X-ray fluorescence (XRF) offers a potential measurement technique through assessment of the change in x-ray signal peak intensity on the continuum of radiation as a function of energy. Panels with varying thicknesses were tested. In general, the data show that as coating thickness increases so does the XRF intensity. It has also been found that by adding a zinc marker to the coating on an aluminum substrate a broader spread of intensity readings was obtained than with an iron marker. Homogeneity of the marker in the coating appears to be critical to this potential measurement system, Further research is needed to document the use of XRF instrumentation as a tool for coating thickness measurement.

Paper Details

Date Published: 12 August 1986
PDF: 3 pages
Proc. SPIE 0691, X-Ray Imaging II, (12 August 1986); doi: 10.1117/12.936627
Show Author Affiliations
Thomas W. Oakes, Fuzetron Methods Research (United States)
Robert E. Oakes, Fuzetron Methods Research (United States)


Published in SPIE Proceedings Vol. 0691:
X-Ray Imaging II
D. Keith Bowen; Larry V. Knight, Editor(s)

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