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Proceedings Paper

Theoretical Considerations in the Design of Multilayer X-Ray Optics
Author(s): Raymond T. Perkins; James M. Thorne; Hans K. Pew
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Paper Abstract

There is increasing interest in the application of multilayers to figured x-ray optics. Two concepts in design approach are presented. The requirements for image formation with a multilayer device are discussed. A geometrical approach is used. The possible affect of multilayers on image quality are studied. Models for the reflectivity of x rays by multilayers are compared briefly.

Paper Details

Date Published: 12 August 1986
PDF: 7 pages
Proc. SPIE 0691, X-Ray Imaging II, (12 August 1986); doi: 10.1117/12.936623
Show Author Affiliations
Raymond T. Perkins, Brigham Young University (United States)
James M. Thorne, Brigham Young University (United States)
Hans K. Pew, Brigham Young University (United States)

Published in SPIE Proceedings Vol. 0691:
X-Ray Imaging II
D. Keith Bowen; Larry V. Knight, Editor(s)

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