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Proceedings Paper

Metal Reflectors in the EUV
Author(s): Marion L. Scott; Paul N. Arendt; Bernard Cameron; Richard Cordi; Brian Newnam; David Windt; Webster Cash
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Paper Abstract

High reflectance mirrors are difficult to achieve in the extreme ultraviolet (EUV) and we have found that one of the principle reasons is the presence of contamination layers on the surface of these reflectors.1 We have begune7study of these contamination layers that form even in an ultra-high vacuum (UHV) system. ' Our initial study consists of monitoring the growth of these contamination layers on various metal surfaces utilizing Auger electron spectroscopy (AES). A principal conclusion from this work is that the rate of growth of oxide and carbon contamination layers on Al, Si, and Rh is greatly enhanced if the ion gauges and Auger filaments are operating. Reflectance measurements on Rh at 11.3 nm also indicate the presence of significant carbon contamination on samples exposed to air. In addition, we find that oxide growth on Ag is negligible and carbon contamination is minimal.

Paper Details

Date Published: 12 August 1986
PDF: 8 pages
Proc. SPIE 0691, X-Ray Imaging II, (12 August 1986); doi: 10.1117/12.936616
Show Author Affiliations
Marion L. Scott, Los Alamos National Laboratory (United States)
Paul N. Arendt, Los Alamos National Laboratory (United States)
Bernard Cameron, Los Alamos National Laboratory (United States)
Richard Cordi, Los Alamos National Laboratory (United States)
Brian Newnam, Los Alamos National Laboratory (United States)
David Windt, University of Colorado (United States)
Webster Cash, University of Colorado (United States)


Published in SPIE Proceedings Vol. 0691:
X-Ray Imaging II
D. Keith Bowen; Larry V. Knight, Editor(s)

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