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Proceedings Paper

Normal Incidence Reflection Multilayer Optics for Solar Soft X-Ray/Extreme Ultraviolet (XUV) Observations
Author(s): Joakim F. Lindblom; Arthur B. C. Walker; Troy W. Barbee
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Paper Abstract

Normal incidence reflection multilayer optics show promise in enabling high spatial resolution (better than 1 arcsec) and low to moderate spectral resolution (λ/▵λ = 8 - 200) imaging in the soft X-ray/XUV spectral regime (40 - 300 Å). In preparation for a Solar X-Ray/XUV Sounding Rocket observation in late 1986 which will utilize normal incidence reflection X-ray optics, several multilayer coatings have been deposited on concave and convex spherical surfaces. The coatings are tungsten-carbon and molybdenum-silicon multilayers and are designed for normal incidence reflection at wavelengths ranging from 44 Å to 304 ⇔. The multilayers havebeen characterized in the laboratory in normal and glancing incidence modes using 1.54 Å to 114 Å radiation. In addition to measuring spectral resolution and absolute reflectivities, multilayer-coated optics have been successfully tested in the imaging mode. This paper will review the measured characteristics of the multilayer coatings and optics and will describe the optical configurations planned for the upcoming solar observation.

Paper Details

Date Published: 12 August 1986
PDF: 9 pages
Proc. SPIE 0691, X-Ray Imaging II, (12 August 1986); doi: 10.1117/12.936615
Show Author Affiliations
Joakim F. Lindblom, Stanford University (United States)
Arthur B. C. Walker, Stanford University (United States)
Troy W. Barbee, Lawrence Livermore National Laboratory (United States)


Published in SPIE Proceedings Vol. 0691:
X-Ray Imaging II
D. Keith Bowen; Larry V. Knight, Editor(s)

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