Share Email Print
cover

Proceedings Paper

Surface Structure Analysis Using Grazing Incidence X-ray Scattering
Author(s): S. Brennan
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A description of the Grazing Incidence X-ray Scattering technique is presented including examples of the wide variety of work being performed in the areas of ordered overlayer structure determination, phase transition studies of ordered overlayers and structural studies of thin amorphous films.

Paper Details

Date Published: 12 August 1986
PDF: 5 pages
Proc. SPIE 0690, X-Rays in Materials Analysis: Novel Applications and Recent Developments, (12 August 1986); doi: 10.1117/12.936608
Show Author Affiliations
S. Brennan, Stanford University (United States)


Published in SPIE Proceedings Vol. 0690:
X-Rays in Materials Analysis: Novel Applications and Recent Developments
Thomas W. Rusch, Editor(s)

© SPIE. Terms of Use
Back to Top