Share Email Print
cover

Proceedings Paper

EXAFS And Reflectivity Studies Of Surfaces And Interfaces Using Glancing Angle X-Rays
Author(s): S. M. Heald; H. Chen; J. M. Tranquada
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

X-rays at glancing angles have a short controllable penetration depth which can be used to advantage in studying surfaces and interfaces. Data are presented for Cu-Al and Ag-Au bilayers which demonstrate the utility of x-ray reflectivity and extended x-ray absorption fine structure (EXAFS) measurements. X-ray reflectivity measurements are sensitive to layer thickness and interface roughness, while the EXAFS probes the atomic scale envir'onment of the interface atoms. As the samples are annealed clear changes are observed in both techniques indicative of the growth of interfacial CuAl2 for the Cu-Al samples and interdiffusion for Ag-Au. Interface sensitivity is verified for the Cu-Al samples by the observations that the EXAFS signal changes from Cu-like to CuAl2-like with the growth of ~ 100 A of CuAl2. Quantitative fits to the x-ray reflectivity data are used to obtain interface roughness, and indicate that the growing CuAl2 layer has a roughness comparable to its thickness. This is consistent with compound growth proceeding predominantly along grain boundaries.

Paper Details

Date Published: 12 August 1986
PDF: 6 pages
Proc. SPIE 0690, X-Rays in Materials Analysis: Novel Applications and Recent Developments, (12 August 1986); doi: 10.1117/12.936595
Show Author Affiliations
S. M. Heald, Brookhaven National Laboratory (United States)
H. Chen, Brookhaven National Laboratory (United States)
J. M. Tranquada, Brookhaven National Laboratory (United States)


Published in SPIE Proceedings Vol. 0690:
X-Rays in Materials Analysis: Novel Applications and Recent Developments
Thomas W. Rusch, Editor(s)

© SPIE. Terms of Use
Back to Top