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Proceedings Paper

Time-Dependent X-Ray Reflectivity of a Germanium Crystal Heated with 25 ps 1.06 µm Laser Light
Author(s): C. J. Hailey; G. Busch; R. Johnson; Z. Koenig; J. Lupton; R. Schroeder; D. Sullivan; W. Goldstein
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Paper Abstract

Preliminary experimental and theoretical studies have been undertaken of the time dependent x-ray reflectivity of a germanium crystal under pulsed laser illumination. The integrated x-ray reflectivity is used as a temperature probe of the crystal. The Chroma laser system at KMS Fusion provided a 1.054 μm (IR) heating pulse with a 25 ps (FWHM) width. Fluences on the germanium (333) crystal varied from 0 to 2 Vcm2. The germanium crystal was simultaneously irradiated with high intensity x-rays from a laser plasma. The emitting plasma was formed by directing a high energy, 0.527 μm laser at a manganese target. The time history of the x-rays reflected from the crystal was detected by an x-ray streak camera. A computer code was written which models temperature dependent dynamical x-ray diffraction. The code takes into account the heating beam absorption profile, depth-dependent Debye-Waller effect and thermal strain profile. The present setup is sensitive to reflectivity changes of 20%. With some improvements, the technique appears to have some promise for real-time studies of crystal behavior.

Paper Details

Date Published: 12 August 1986
PDF: 4 pages
Proc. SPIE 0690, X-Rays in Materials Analysis: Novel Applications and Recent Developments, (12 August 1986); doi: 10.1117/12.936593
Show Author Affiliations
C. J. Hailey, KMS Fusion, Inc. (United States)
G. Busch, KMS Fusion, Inc. (United States)
R. Johnson, KMS Fusion, Inc. (United States)
Z. Koenig, KMS Fusion, Inc. (United States)
J. Lupton, KMS Fusion, Inc. (United States)
R. Schroeder, KMS Fusion, Inc. (United States)
D. Sullivan, KMS Fusion, Inc. (United States)
W. Goldstein, Lawrence Livermore National Laboratory (United States)


Published in SPIE Proceedings Vol. 0690:
X-Rays in Materials Analysis: Novel Applications and Recent Developments
Thomas W. Rusch, Editor(s)

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