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Proceedings Paper

Performance of Oblique Angle of Incidence Collection Systems in the VUV
Author(s): Geza L. Keller; Marion L. Scott; Kenneth Mitchell
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Paper Abstract

High rejection filters are difficult enough to achieve in the UV-VIS-IR with known materials and constants. Even more difficult is the design and manufacture of rejection filters in the EUV and VUV given the uncertainty of optical constants and their wide variation over this spectral range. We have begun work to characterize materials from 584 Å to 1,300 Å to verify reported optical constants, in order to design and realize the optimum collection system.

Paper Details

Date Published: 12 August 1986
PDF: 7 pages
Proc. SPIE 0689, X-Ray Calibration: Techniques, Sources, and Detectors, (12 August 1986); doi: 10.1117/12.936586
Show Author Affiliations
Geza L. Keller, University of California (United States)
Marion L. Scott, University of California (United States)
Kenneth Mitchell, University of California (United States)


Published in SPIE Proceedings Vol. 0689:
X-Ray Calibration: Techniques, Sources, and Detectors
Ping Lee; Paul D. Rockett, Editor(s)

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