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Proceedings Paper

Crystal R[sub]c[/sub] Calibrations with an Uncollimated, Point X-Ray Source
Author(s): Paul D. Rockett; C. R. Bird; C. J. Hailey; Z. Koenig; J. Lupton; J. Geddes
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Paper Abstract

The calibration of crystal integrated reflectivity can be faithfully performed with an uncollimated, well-filtered point x-ray source. In this geometry the angle of illumination of the crystal greatly exceeds the crystal rocking angle. The crystal essentially collimates the scattered beam, establishing the detector acceptance angle. We have measured single crystal Rc's in this way for a variety of crystals including PET, Beryl, LiF (200), several synthetic multilayers, silicon (111), and KAP. In addition we report the first measured Rc for convex curved metal multilayer crystals.

Paper Details

Date Published: 12 August 1986
PDF: 7 pages
Proc. SPIE 0689, X-Ray Calibration: Techniques, Sources, and Detectors, (12 August 1986); doi: 10.1117/12.936573
Show Author Affiliations
Paul D. Rockett, KMS Fusion, Inc. (United States)
C. R. Bird, KMS Fusion, Inc. (United States)
C. J. Hailey, KMS Fusion, Inc. (United States)
Z. Koenig, KMS Fusion, Inc. (United States)
J. Lupton, KMS Fusion, Inc. (United States)
J. Geddes, KMS Fusion, Inc. (United States)


Published in SPIE Proceedings Vol. 0689:
X-Ray Calibration: Techniques, Sources, and Detectors
Ping Lee; Paul D. Rockett, Editor(s)

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