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Proceedings Paper

VUV Spectrometer-Detector System Calibration Using Synchrotron Radiation
Author(s): Armon McPherson; Ned Rouze; David Graves; Willem B. Westerveld; John S. Risley
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Paper Abstract

A method of absolute calibration of a VUV spectrometer-detector system is presented in which continuum synchrotron radiation is used. Calibration of the optical system is performed for the purpose of absolute measurements of electron impact photoemission cross sections for discrete atomic (molecular) transitions in the VUV wavelength region. A large computer-controlled multiadjustable manipulator is used for positioning the spectrometer-detector system with respect to a beam of synchrotron radiation. The manipulator allows rotation with respect to two perpendicular axes, one collinear with the electron beam, and the other collinear with the spectrometer entrance slit. Using these rotations, a beam of synchrotron radiation is scanned across the grating surface resulting in a precise simulation of the source geometry encountered in the electron-atom collision source. In this way the absolute response of the spectrometer-detector system and the geometrical factors encountered in the electron-atom source are determined in an integral fashion allowing absolute photoemission cross sections to be determined with unparalleled precision.

Paper Details

Date Published: 12 August 1986
PDF: 7 pages
Proc. SPIE 0689, X-Ray Calibration: Techniques, Sources, and Detectors, (12 August 1986); doi: 10.1117/12.936566
Show Author Affiliations
Armon McPherson, University of Illinois at Chicago (United States)
Ned Rouze, Hope College (United States)
David Graves, North Carolina State University (United States)
Willem B. Westerveld, North Carolina State University (United States)
John S. Risley, North Carolina State University (United States)


Published in SPIE Proceedings Vol. 0689:
X-Ray Calibration: Techniques, Sources, and Detectors
Ping Lee; Paul D. Rockett, Editor(s)

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