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Proceedings Paper

A High Intensity Line Source For X-Ray Spectrometer Calibration
Author(s): R. S. Thoe
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Paper Abstract

A high intensity electron-impact x-ray source using a one-dimensional Pierce lens has been built for the purpose of calibrating a bent crystal x-ray spectrometer. This source focuses up to 100 mA of 20-keV electrons to a line on a liquid-cooled anode. The line (which can serve as a virtual slit for the spectrometer) measures approximately 800 µ x 2 cm. The source is portable and therefore adaptable to numerous types of spectrometer applications. One particular application, the calibration of a high resolution (r = 104) time-resolved crystal spectrometer, will be discussed in detail.

Paper Details

Date Published: 12 August 1986
PDF: 8 pages
Proc. SPIE 0689, X-Ray Calibration: Techniques, Sources, and Detectors, (12 August 1986); doi: 10.1117/12.936558
Show Author Affiliations
R. S. Thoe, University of California (United States)


Published in SPIE Proceedings Vol. 0689:
X-Ray Calibration: Techniques, Sources, and Detectors
Ping Lee; Paul D. Rockett, Editor(s)

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