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Proceedings Paper

A Description Of The Focal Plane/Detector Test And Evaluation Lab At MDAC-HB
Author(s): D. D. Beebe; J. J. Lowe; C. Sheldon; E. S. D'Ippolito; A. G. Osler; W. F. Morgan
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Paper Abstract

A description of a test facility for testing and evaluating visible and infrared (IR) focal plane arrays (FPA's) and associated components and subsystems is given. The facility is comprised of three computer controlled test systems for characterization of hybrid FPA's, detector arrays, and readout electronics under cryogenic conditions. Facility capabilities include FPA assembly and dewar test and assembly.

Paper Details

Date Published: 10 December 1986
PDF: 8 pages
Proc. SPIE 0685, Infrared Technology XII, (10 December 1986); doi: 10.1117/12.936499
Show Author Affiliations
D. D. Beebe, McDonnell Douglas Astronautics Company (United States)
J. J. Lowe, McDonnell Douglas Astronautics Company (United States)
C. Sheldon, McDonnell Douglas Astronautics Company (United States)
E. S. D'Ippolito, McDonnell Douglas Astronautics Company (United States)
A. G. Osler, McDonnell Douglas Astronautics Company (United States)
W. F. Morgan, McDonnell Douglas Astronautics Company (United States)


Published in SPIE Proceedings Vol. 0685:
Infrared Technology XII
Richard A. Mollicone; Irving J. Spiro, Editor(s)

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