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Proceedings Paper

Thermal Wave Imaging
Author(s): Richard M. Miller
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Paper Abstract

Thermal wave imaging is a non-destructive testing technique which uses optically induced heat fluxes to probe the physical and chemical properties of solid samples. Localised heat sources are generated by the absorption of light from a focussed laser beam, and the propagation of heat from these sources is modified by the local thermal properties of the sample, providing a contrast mechanism. The technique can be applied to transparent, translucent and opaque materials. Information can be obtained about the thickness of coatings, the integrity of coating substrate interfaces, the presence of microscopic defects and inclusions, and the thermal characteristics of the material. Information can be obtained with a resolution of a few microns in both the X-Y plane, and along the Z-axis into the sample.

Paper Details

Date Published: 10 December 1986
PDF: 7 pages
Proc. SPIE 0685, Infrared Technology XII, (10 December 1986); doi: 10.1117/12.936491
Show Author Affiliations
Richard M. Miller, Unilever Research Port Sunlight Laboratory (United States)


Published in SPIE Proceedings Vol. 0685:
Infrared Technology XII
Richard A. Mollicone; Irving J. Spiro, Editor(s)

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