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Proceedings Paper

Effects Of Surface And Bulk Defects In Transmitting Materials On Optical Resolution And Scattered Light
Author(s): H. E. Bennett; D. W. Ricks
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Paper Abstract

The origin of scattered light, particularly near-angle scattered light, and its effect on optical resolution have been analyzed. Also, an instrument is described that can measure near-angle scatter. An application of Rayleigh and Mie scattering theories shows that a few large defects cause a high level of near-angle scatter, which leads to a loss of resolution. The degradation in resolution is severe when trying to resolve a bright object near a faint object. A relatively simple apparatus has been built that can measure near-angle scatter at angles as small as 0.03 degrees and at levels of 10-6 peak intensity.

Paper Details

Date Published: 19 December 1986
PDF: 7 pages
Proc. SPIE 0683, Infrared and Optical Transmitting Materials, (19 December 1986); doi: 10.1117/12.936431
Show Author Affiliations
H. E. Bennett, Naval Weapons Center (United States)
D. W. Ricks, Naval Weapons Center (United States)

Published in SPIE Proceedings Vol. 0683:
Infrared and Optical Transmitting Materials
Robert W. Schwartz, Editor(s)

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