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Proceedings Paper

Compressive Thin Films For Increased Fracture Toughness
Author(s): P. H. Kobrin; A. B. Harker
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Paper Abstract

Improved fracture toughness by as much as a factor of two in infrared window materials has been observed after the deposition of thin compressive surface films by reactive ion beam techniques. The relationship between film stress, film thickness, substrate properties, and observed fracture toughness are being investigated, using Vickers indentation to determine mechanical properties and a bending plate capacitance method to independently determine film stress. Comparisons are made to a theoretical model developed by Lawn and Fuller.

Paper Details

Date Published: 19 December 1986
PDF: 7 pages
Proc. SPIE 0683, Infrared and Optical Transmitting Materials, (19 December 1986); doi: 10.1117/12.936429
Show Author Affiliations
P. H. Kobrin, Rockwell International Science Center (United States)
A. B. Harker, Rockwell International Science Center (United States)


Published in SPIE Proceedings Vol. 0683:
Infrared and Optical Transmitting Materials
Robert W. Schwartz, Editor(s)

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